X-ray field & Fan-Beam Measurement

bigproduct5X-ray field & Fan-Beam Measurement

QUART nonius

The QUART nonius is an easy-to-use but very sophistication measuring instrument to verify size and geometric properties of X-ray fields. It can also be used to analyse characteristic of fanned X-ray beam. The QUART nonius is technically highly flexible. It can be used in digital as well as conventional X-ray technology. In any case, its precision is an absolute strong point-as it goes down into to the nonius range of 0.1 mm.

Digitisation in X-ray technology makes traditional screen- films available. Originally, they were used for checks on X-ray beam properties. Today, the QUART nonuis performs the same task. Yet, it provides more substantial features.

 

Technical Specification

Accuracy/ Resolution +/- 0.1 mm
Exposure Threshold Dose ≥ 200 µGy/s

Dose Rate ≥ 20 µGy/s

Minimum Exposure Variable; depends on application
Measurement Method Open measurement – no added filtration
Connectivity Standard USB (2.0)

Plug and Play Component

Operation Temperature Range

Storage Temperature Range

15-40º C

0-50º C

System Requirements

Operation System

Pentium III, 128 Mb RAM, min. 1×USB

Windows 7, Vista, XP

Sensor Area 40 mm Length (16 active sensor Element)

Radiopaque center marker (Visible in test exposure)

Improved section for light field and laser markings

Weight 190 g (Without USB Cable)
Size of Head Unit 55 × 75 × 15 mm (W × L × H)

 

 

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